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ANSYS Technical Study Compares AM Monitoring Methods

ANSYS Technical Study Compares AM Monitoring Methods

This new technical paper reflects a collaboration between ANSYS Inc.’s Additive Team, Sigma Labs and National Institute of Standards and Technology.

The study compares thermal history capabilities from ANSYS additive manufacturing simulation solutions with thermal imaging results from Sigma Labs using the NIST Additive Manufacturing Test Artifact as a basis.

STUDY
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